发明名称 Metrology instruments
摘要 A metrology instrument, such as a probe, probe head, stylus or stylus arm, for mounting on a coordinate position apparatus. The metrology instrument is at least partially constructed from at least one sheet of thermally stable metallic material which is folded to form a three dimensional structure. The at least one sheet of thermally stable material is utilized in the metrology loop of the metrology instrument.
申请公布号 US7506455(B2) 申请公布日期 2009.03.24
申请号 US20040576026 申请日期 2004.10.21
申请人 RENISHAW PLC 发明人 HUNTER STEPHEN PAUL;DERRICK HUGO GEORGE;MCMURTRY DAVID ROBERTS
分类号 G01B5/00;G01B5/012;G01B5/12;G01Q70/04 主分类号 G01B5/00
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