发明名称 Method for manufacturing semiconductor device
摘要 An object of the present invention is to provide a method for manufacturing a semiconductor device in which, after crystallizing by using an element that promotes crystallization, holes are prevented from being generated in a crystalline semiconductor film with a concentration of the element in the crystalline semiconductor film decreased by performing gettering. To solve the problem, as a feature of the structure of the invention, in the case of removing a silicon oxide film formed over the semiconductor film, an etchant made of a solution containing fluorine and a substance having surface activity is used.
申请公布号 US7507617(B2) 申请公布日期 2009.03.24
申请号 US20040012172 申请日期 2004.12.16
申请人 发明人
分类号 H01L21/20;H01L21/84;G02F1/136;H01L21/00;H01L21/336 主分类号 H01L21/20
代理机构 代理人
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