发明名称 X-ray analysis apparatus
摘要 When an X-ray focused by using an X-ray lens is irradiated to a sample, there is generated an X-ray halo component at the peripheral part of the focal point of the focused X-ray in the sample and, by this, precision of an analysis of a microscopic region becomes an issue. In order to control the shape of the X-rays from the X-ray lens, a collimator is installed between the X-ray lens and the sample, with an opening part having a tapering shape in which the opening at the side toward the sample is made smaller than that at the side toward the X-ray lens.
申请公布号 US7508907(B2) 申请公布日期 2009.03.24
申请号 US20070845540 申请日期 2007.08.27
申请人 SII NANOTECHNOLOGY INC. 发明人 SASAYAMA NORIO
分类号 G01N23/223;G21K1/02 主分类号 G01N23/223
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