发明名称 CIRCUIT FOR CONTROLLING SELF REFRESH IN SEMICONDUCTOR MEMORY APPARATUS
摘要 A self refresh control circuit of a semiconductor memory device is provided to perform an operation such as a refresh property of a memory cell by selecting an output signal of one among circuits having two or more temperature property. A temperature sensor(300) senses temperature of a semiconductor memory chip. A first cycle signal generating part(400) generates a first self refresh signal according to a first temperature property cycle tilt based on a sensing result of the temperature sensor. A second cycle signal generating part(500) generates a second self refresh signal according to a second temperature property cycle tilt based on a sensing result of the temperature sensor. A cycle sensing part(600) receives the first self refresh signal and the second self refresh signal, and selectively outputs one among the first self refresh signal and the second self refresh signal according to a refresh property of the memory cell.
申请公布号 KR20090029769(A) 申请公布日期 2009.03.23
申请号 KR20090016651 申请日期 2009.02.27
申请人 HYNIX SEMICONDUCTOR INC. 发明人 JEONG, BONG HWA
分类号 G11C11/402;G11C11/406 主分类号 G11C11/402
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