发明名称 |
Event driven switch level simulation method and simulator |
摘要 |
A method for simulating an integrated circuit includes performing a power supply voltage tuning operation to find a power supply voltage at which a simulation of the integrated circuit at an operating frequency passes a functional requirement, identifying a weak signal node based on the simulation result, and performing a size tuning operation on the weak signal node of the integrated circuit.
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申请公布号 |
US7506284(B2) |
申请公布日期 |
2009.03.17 |
申请号 |
US20060336744 |
申请日期 |
2006.01.19 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
LEE SEUK-WHAN;YOO MOON-HYUN;CHOI JOON-HO |
分类号 |
G06F17/50 |
主分类号 |
G06F17/50 |
代理机构 |
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代理人 |
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地址 |
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