发明名称 Positive resist composition, method for resist pattern formation and compound
摘要 A positive resist composition that includes a base material component (A) that contains an acid-dissociable, dissolution-inhibiting group and exhibits increased alkali solubility under the action of acid, and an acid generator component (B) that generates acid upon exposure, wherein the base material component (A) contains a compound (A1), in which either a portion of, or all of, hydrogen atoms of phenolic hydroxyl groups within a polyhydric phenol compound, which has two or more phenolic hydroxyl groups, a molecular weight of 300 to 2,500, and is represented by a general formula (I) shown below, have been substituted with an acid-dissociable, dissolution-inhibiting group (II) represented by a general formula (II) shown below.
申请公布号 US7504196(B2) 申请公布日期 2009.03.17
申请号 US20060884748 申请日期 2006.02.09
申请人 TOKYO OHKA KOGYO CO., LTD. 发明人 SHIONO DAJU;HIRAYAMA TAKU;HADA HIDEO
分类号 G03F7/004;G03F7/30 主分类号 G03F7/004
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