发明名称 Temperature measurement apparatus and method for measuring temperatures by using RF signals of different frequencies
摘要 Disclosed are a temperature measurement apparatus and method for measuring temperature by using RF signals having different frequencies. The temperature measurement apparatus includes a parameter generation unit for generating a first parameter based on a radio frequency (RF) signal having a first frequency and a second parameter based on an RF signal having a second frequency; a parameter detection unit for detecting the generated first and second parameters; and a control unit for calculating a temperature value based on the detected first and second parameters. Accordingly, the temperature measurement apparatus can measure temperature by use of existing components and received RF signals without any addition of a temperature sensor, as well as measure temperature precisely without having any influence on the intensities of RF signals that can vary due to the changes of transmission distances and signal-receiving environments.
申请公布号 US7503690(B2) 申请公布日期 2009.03.17
申请号 US20050148304 申请日期 2005.06.09
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 SONG IL-JONG;KU JA-NAM;MIN YOUNG-HOON;KWON SANG-WOOK
分类号 G01J5/00;G01K1/02;G01K7/01;G01K13/00;G06K17/00;G06K19/00;G06K19/07 主分类号 G01J5/00
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