发明名称 GATE STRUCTURE AND METHOD FOR MANUFACTURING OF THE SAME
摘要 A gate structure and method for manufacturing of the same is provided to reduce the resistance of the metal gate when forming a metal gate with a tungsten layer. A gate structure is compose of a gate conductive layer(104), a first metal barrier layer(106) arranged on the gate conductive layer, and a second metal barrier layer including a first sub metal layer(108) and a second sub metal layer(110). A core growing layer having a beta crystalline structure is arranged on the second metal barrier layer and the metal layer on the core growing layer. The first sub metal barrier layer has a first nitrogen and second metal barrier layer has a second nitrogen of which content is lower than that of the second nitrogen.
申请公布号 KR20090026646(A) 申请公布日期 2009.03.13
申请号 KR20070091750 申请日期 2007.09.10
申请人 HYNIX SEMICONDUCTOR INC. 发明人 YOO, CHANG JUN
分类号 H01L21/336 主分类号 H01L21/336
代理机构 代理人
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