发明名称 METHOD FOR FORMING DIELECTRIC LAYER OF SEMICONDUCTOR DEVICE
摘要 A method for forming dielectric layer of semiconductor device is provided to increase production yield by improving the characteristic of the device. A method for forming dielectric layer of semiconductor device is comprised of the steps: forming a conductive pattern(210) on a semiconductor substrate(200); forming a first reactor (220a) on the surface of the conductive pattern; forming the interlayer insulating film(230) covering the conductive pattern; forming the second reactor (220b) on the surface of the interlayer insulating film; annealing interlayer insulating film.
申请公布号 KR20090026677(A) 申请公布日期 2009.03.13
申请号 KR20070091792 申请日期 2007.09.10
申请人 HYNIX SEMICONDUCTOR INC. 发明人 CHUNG, CHAE O;LEE, JONG MIN;KIM, CHAN BAE;AN, HYEON JU;LEE, HYO SEOK;MIN, SUNG KYU
分类号 H01L21/31 主分类号 H01L21/31
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