发明名称 GATE DRIVE CIRCUIT OF SEMICONDUCTOR DEVICE AND GATE DRIVE METHOD
摘要 <P>PROBLEM TO BE SOLVED: To improve trade-off characteristics of noise and switching loss generated during turn-off switching. <P>SOLUTION: A first MOSFET21 and a second MOSFET22 are connected to a DC power supply in series and a gate terminal of a semiconductor device 1 is connected to a negative-potential-side terminal of the first MOSFET21 and a positive-potential-side terminal of the second MOSFET22. An emitter terminal of the semiconductor device 1 is connected to a negative-potential-side terminal of the second MOSFET22 and a serial circuit of a capacitor 25 and a third MOSFET23 is connected to the second MOSFET22 in parallel. When the semiconductor device 1 is turned off, the second and third MOSFET22, 23 are turned on with the first MOSFET21 turned off. <P>COPYRIGHT: (C)2009,JPO&INPIT
申请公布号 JP2009055696(A) 申请公布日期 2009.03.12
申请号 JP20070219244 申请日期 2007.08.27
申请人 FUJI ELECTRIC DEVICE TECHNOLOGY CO LTD 发明人 YAMASHIRO HIROSUKE;TAKUBO HIROSHI
分类号 H02M1/08;H03K17/04;H03K17/16;H03K17/56;H03K17/687 主分类号 H02M1/08
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