发明名称 |
GATE DRIVE CIRCUIT OF SEMICONDUCTOR DEVICE AND GATE DRIVE METHOD |
摘要 |
<P>PROBLEM TO BE SOLVED: To improve trade-off characteristics of noise and switching loss generated during turn-off switching. <P>SOLUTION: A first MOSFET21 and a second MOSFET22 are connected to a DC power supply in series and a gate terminal of a semiconductor device 1 is connected to a negative-potential-side terminal of the first MOSFET21 and a positive-potential-side terminal of the second MOSFET22. An emitter terminal of the semiconductor device 1 is connected to a negative-potential-side terminal of the second MOSFET22 and a serial circuit of a capacitor 25 and a third MOSFET23 is connected to the second MOSFET22 in parallel. When the semiconductor device 1 is turned off, the second and third MOSFET22, 23 are turned on with the first MOSFET21 turned off. <P>COPYRIGHT: (C)2009,JPO&INPIT |
申请公布号 |
JP2009055696(A) |
申请公布日期 |
2009.03.12 |
申请号 |
JP20070219244 |
申请日期 |
2007.08.27 |
申请人 |
FUJI ELECTRIC DEVICE TECHNOLOGY CO LTD |
发明人 |
YAMASHIRO HIROSUKE;TAKUBO HIROSHI |
分类号 |
H02M1/08;H03K17/04;H03K17/16;H03K17/56;H03K17/687 |
主分类号 |
H02M1/08 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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