发明名称 |
EXPOSURE METHOD AND APPARATUS, AND ELECTRONIC DEVICE MANUFACTURING METHOD |
摘要 |
An exposure method provided is a high-resolution and inexpensive method suitable for use in formation of a fine pattern for making up an electronic device. A diffraction grating is located in proximity to a wafer or the like for making up an electronic device, and illumination light with a predetermined incidence angle property is applied onto the diffraction grating to effect exposure on the wafer. The exposure is done while changing a positional relation between the semiconductor wafer and the diffraction grating according to need.
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申请公布号 |
US2009068597(A1) |
申请公布日期 |
2009.03.12 |
申请号 |
US20060795198 |
申请日期 |
2006.01.13 |
申请人 |
SHIRAISHI NAOMASA |
发明人 |
SHIRAISHI NAOMASA |
分类号 |
G03F7/20;G03B27/32;G03B27/72 |
主分类号 |
G03F7/20 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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