发明名称 EXPOSURE METHOD AND APPARATUS, AND ELECTRONIC DEVICE MANUFACTURING METHOD
摘要 An exposure method provided is a high-resolution and inexpensive method suitable for use in formation of a fine pattern for making up an electronic device. A diffraction grating is located in proximity to a wafer or the like for making up an electronic device, and illumination light with a predetermined incidence angle property is applied onto the diffraction grating to effect exposure on the wafer. The exposure is done while changing a positional relation between the semiconductor wafer and the diffraction grating according to need.
申请公布号 US2009068597(A1) 申请公布日期 2009.03.12
申请号 US20060795198 申请日期 2006.01.13
申请人 SHIRAISHI NAOMASA 发明人 SHIRAISHI NAOMASA
分类号 G03F7/20;G03B27/32;G03B27/72 主分类号 G03F7/20
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