发明名称 LAMINATE STRUCTURE OF GROUP III NITRIDE SEMICONDUCTOR, MANUFACTURING METHOD THEREOF, SEMICONDUCTOR LIGHT-EMITTING ELEMENT, AND LAMP
摘要 <P>PROBLEM TO BE SOLVED: To obtain a crystal layer as a buffer layer with sufficient uniformity and to obtain a film of sufficient crystallinity at the time of forming a group III nitride semiconductor crystal structure on the crystal layer. <P>SOLUTION: A laminate structure of the group III nitride semiconductor has a first layer consisting of group III nitride, which is formed by a sputtering method, on a substrate and a has a second layer which is brought into contact with the first layer and consists of a group III nitride material. The first layer is formed inside a chamber of a film forming device and is formed with a condition that ultimate vacuum in the chamber of the film forming device is not more than 1.0&times;10<SP>-3</SP>Pa. <P>COPYRIGHT: (C)2009,JPO&INPIT
申请公布号 JP2009054767(A) 申请公布日期 2009.03.12
申请号 JP20070219671 申请日期 2007.08.27
申请人 SHOWA DENKO KK 发明人 YOKOYAMA TAISUKE;MIKI HISAYUKI
分类号 H01L21/203;C23C14/06;C23C14/34;C23C16/34;C30B29/38;H01L21/205;H01L33/06;H01L33/16;H01L33/32;H01L33/62 主分类号 H01L21/203
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