发明名称 |
LAMINATE STRUCTURE OF GROUP III NITRIDE SEMICONDUCTOR, MANUFACTURING METHOD THEREOF, SEMICONDUCTOR LIGHT-EMITTING ELEMENT, AND LAMP |
摘要 |
<P>PROBLEM TO BE SOLVED: To obtain a crystal layer as a buffer layer with sufficient uniformity and to obtain a film of sufficient crystallinity at the time of forming a group III nitride semiconductor crystal structure on the crystal layer. <P>SOLUTION: A laminate structure of the group III nitride semiconductor has a first layer consisting of group III nitride, which is formed by a sputtering method, on a substrate and a has a second layer which is brought into contact with the first layer and consists of a group III nitride material. The first layer is formed inside a chamber of a film forming device and is formed with a condition that ultimate vacuum in the chamber of the film forming device is not more than 1.0×10<SP>-3</SP>Pa. <P>COPYRIGHT: (C)2009,JPO&INPIT |
申请公布号 |
JP2009054767(A) |
申请公布日期 |
2009.03.12 |
申请号 |
JP20070219671 |
申请日期 |
2007.08.27 |
申请人 |
SHOWA DENKO KK |
发明人 |
YOKOYAMA TAISUKE;MIKI HISAYUKI |
分类号 |
H01L21/203;C23C14/06;C23C14/34;C23C16/34;C30B29/38;H01L21/205;H01L33/06;H01L33/16;H01L33/32;H01L33/62 |
主分类号 |
H01L21/203 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|