发明名称 TEMPERATURE DETECTION CIRCUIT
摘要 PROBLEM TO BE SOLVED: To provide a temperature compensation circuit that is hardly affected by element variation. SOLUTION: Two sets of series connections of diode connection transistors Q1 and Q2 and resistors R1 and R2 are prepared in the inverted order, and current is made to flow from a power supply to them. Voltages V1 and V2 depending on the temperature are thus taken out from the nodes of the diode connection transistors Q1 and Q2 and resistors R1 and R2 of each set. The difference between the taken voltages V1 and V2 is amplified by a differential amplifier including transistors Q7 and Q8 and low sulfur R4, and one-way output current I3 that is a current according to the difference between the voltages V1 and V2 is obtained. COPYRIGHT: (C)2009,JPO&INPIT
申请公布号 JP2009053069(A) 申请公布日期 2009.03.12
申请号 JP20070220610 申请日期 2007.08.28
申请人 SANYO ELECTRIC CO LTD;SANYO SEMICONDUCTOR CO LTD 发明人 NIKI MASA;UEKI KEIJIRO
分类号 G01K7/01;H03K3/282 主分类号 G01K7/01
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