发明名称 ELECTRONIC ELEMENT
摘要 PROBLEM TO BE SOLVED: To provide an element having a structure which is directly formed on a semiconductor as a schottky electrode made of a metal having hydrogen absorbing property such as Pt, etc. which has high work function to solve the problem that characteristics changes significantly to temperature or surrounding atmosphere. SOLUTION: A silicon nitride (SixNy) thin film is provided between a semiconductor substrate and the schottky electrode. The silicon nitride (SixNy) thin film has a thickness of 0.5 to 10 nm. COPYRIGHT: (C)2009,JPO&INPIT
申请公布号 JP2009054814(A) 申请公布日期 2009.03.12
申请号 JP20070220476 申请日期 2007.08.28
申请人 NATIONAL INSTITUTE FOR MATERIALS SCIENCE 发明人 IROKAWA YOSHIHIRO;SAKUMA YOSHIKI;SEKIGUCHI TAKASHI
分类号 H01L29/47;H01L29/872 主分类号 H01L29/47
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