发明名称 DISPLAY DEVICE AND MANUFACTURING METHOD THEREOF
摘要 PROBLEM TO BE SOLVED: To provide a method for manufacturing a display device having a reliable threshold-controlled thin-film transistor. SOLUTION: A gate insulating film is formed over a gate electrode, a microcrystalline semiconductor film is formed over the gate insulating film, an impurity element for controlling the threshold is added into the microcrystalline semiconductor film by an ion implantation method, the microcrystalline semiconductor film is irradiated with laser beams so that the crystallinity of the microcrystalline semiconductor film is improved, and then, a buffer layer is formed over the microcrystalline semiconductor film, whereby a channel-etched thin film transistor is formed. Further, the display device including the thin-film transistor is manufactured. COPYRIGHT: (C)2009,JPO&INPIT
申请公布号 JP2009055011(A) 申请公布日期 2009.03.12
申请号 JP20080188700 申请日期 2008.07.22
申请人 SEMICONDUCTOR ENERGY LAB CO LTD 发明人 YAMAZAKI SHUNPEI
分类号 H01L29/786;G02F1/1345;G02F1/1368;H01L21/20;H01L21/268;H01L21/336;H01L51/50;H05B33/10;H05B33/14 主分类号 H01L29/786
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