发明名称 SURFACE INSPECTION METHOD AND SURFACE INSPECTION APPARATUS
摘要 A surface inspection apparatus capable of acquiring scattered light intensity distribution information for each scattering azimuth angle, and detecting foreign matters and defects with high sensitivity. A concave mirror for condensation and another concave mirror for image formation are used to cope with a broad cubic angle. Since mirrors for condensation and image formation are used, a support for clamping the periphery of a lens is unnecessary, and an effective aperture area does not decrease. A plurality of azimuth-wise detection optical systems is disposed and reflected light at all azimuths can be detected by burying the entire periphery without calling for specific lens polishing. A light signal unification unit sums digital data from a particular system corresponding to a scattering azimuth designated in advance in the systems for improving an S/N ratio.
申请公布号 US2009066940(A1) 申请公布日期 2009.03.12
申请号 US20080207536 申请日期 2008.09.10
申请人 HITACHI HIGH-TECHNOLOGIES CORPORATION 发明人 MATSUI SHIGERU
分类号 G01N21/88 主分类号 G01N21/88
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