发明名称 SHAPE MEASUREMENT APPARATUS AND METHOD
摘要 <p>A shape measurement apparatus and method using a laser interferometer are disclosed. The shape measurement apparatus includes a plurality of laser devices, which generate beams, emit a beam of a specific frequency from among the generated beams, and output interference signals for detecting wavelengths of the generated beams, and a controller for detecting the wavelengths of the generated beams from the outputted interference signals, and controlling the laser devices on the basis of the detected wavelengths. The optical unit projects the beam of the laser device on a target object, and generates an interference pattern of the object. Several shutters are closed and opened. If the shutters are closed, they prevent the beam of each laser device to be projected on the optical unit. An image pickup unit captures the interference pattern.</p>
申请公布号 WO2009031770(A1) 申请公布日期 2009.03.12
申请号 WO2008KR04810 申请日期 2008.08.19
申请人 KOREA RESEARCH INSTITUTE OF STANDARDS AND SCIENCE;KIM, JAE-WAN;EOM, TAE-BONG;KIM, JONG-AHN;KANG, CHU-SHIK 发明人 KIM, JAE-WAN;EOM, TAE-BONG;KIM, JONG-AHN;KANG, CHU-SHIK
分类号 G01B11/24 主分类号 G01B11/24
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