发明名称 METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To propose a method of manufacturing a semiconductor device with high yield which includes a semiconductor element having a film with reduced mixing of impurity. SOLUTION: In the manufacturing method of the semiconductor device that forms an insulating film using a plasma CVD device in contact with a semiconductor layer provided on a substrate having an insulating surface, after an inner wall of a reaction chamber of a plasma CVD device is coated with a film not including an impurity of the insulated film, the substrate is inserted into the reaction chamber to form the insulating film on the substrate. COPYRIGHT: (C)2009,JPO&INPIT
申请公布号 JP2009054991(A) 申请公布日期 2009.03.12
申请号 JP20080145684 申请日期 2008.06.03
申请人 SEMICONDUCTOR ENERGY LAB CO LTD 发明人 ICHIJO MITSUHIRO;TANAKA TETSUHIRO;OTSUKI TAKASHI;YASUMOTO KIYOHARU;OKAZAKI KENICHI;YAMAZAKI SHUNPEI;SAKAMOTO NAOYA
分类号 H01L21/318;C23C16/42;C23C16/44;H01L21/336;H01L29/786 主分类号 H01L21/318
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