发明名称 |
METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE |
摘要 |
PROBLEM TO BE SOLVED: To propose a method of manufacturing a semiconductor device with high yield which includes a semiconductor element having a film with reduced mixing of impurity. SOLUTION: In the manufacturing method of the semiconductor device that forms an insulating film using a plasma CVD device in contact with a semiconductor layer provided on a substrate having an insulating surface, after an inner wall of a reaction chamber of a plasma CVD device is coated with a film not including an impurity of the insulated film, the substrate is inserted into the reaction chamber to form the insulating film on the substrate. COPYRIGHT: (C)2009,JPO&INPIT
|
申请公布号 |
JP2009054991(A) |
申请公布日期 |
2009.03.12 |
申请号 |
JP20080145684 |
申请日期 |
2008.06.03 |
申请人 |
SEMICONDUCTOR ENERGY LAB CO LTD |
发明人 |
ICHIJO MITSUHIRO;TANAKA TETSUHIRO;OTSUKI TAKASHI;YASUMOTO KIYOHARU;OKAZAKI KENICHI;YAMAZAKI SHUNPEI;SAKAMOTO NAOYA |
分类号 |
H01L21/318;C23C16/42;C23C16/44;H01L21/336;H01L29/786 |
主分类号 |
H01L21/318 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|