| 摘要 |
PROBLEM TO BE SOLVED: To provide an IC tester capable of shortening the testing time using an existing test program. SOLUTION: When variable data is stored in a data item of signal setting data, the value of variable data acquired this time is compared with the set value last time (S7). When they do not match with each other, the value of the variable data is transmitted to pin electronics and registered (S8). When they match with each other, the processing of transmitting the value of the variable data to the pin electronics and registering it is omitted and an execution command is issued. Thus, the processing time is shortened by omitting the transmission of useless variable data. COPYRIGHT: (C)2009,JPO&INPIT
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