发明名称 METHOD AND APPARATUS FOR DIAGNOSING STATUS OF PARTS IN REAL TIME IN PLASMA PROCESSING EQUIPMENT
摘要 Apparatus and methods for diagnosing status of a consumable part of a plasma reaction chamber, the consumable part including at least one conductive element embedded therein. The method includes the steps of: coupling the conductive element to a power supply so that a bias potential relative to the ground is applied to the conductive element; exposing the consumable part to plasma erosion until the conductive element draws a current from the plasma upon exposure of the conductive element to the plasma; measuring the current; and evaluating a degree of erosion of the consumable part due to the plasma based on the measured current.
申请公布号 WO2009032095(A1) 申请公布日期 2009.03.12
申请号 WO2008US10070 申请日期 2008.08.26
申请人 LAM RESEARCH CORPORATION;PATRICK, ROGER 发明人 PATRICK, ROGER
分类号 H01L21/3065;C23C16/52;C23F4/00 主分类号 H01L21/3065
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