发明名称 CORRECTOR FOR CHARGED PARTICLE BEAM ABERRATION, AND CHARGED PARTICLE BEAM DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a low-cost, high-precision and high-resolution charged particle beam converging optical system for solving problems on a conventional revolution-symmetry aberration correcting system. SOLUTION: In a radial plane having an angle parted by a natural number whose partition number is greater than 2 with the beam radial axis of a charged particle beam generated by a charged particle beam source, as an axis of revolution, a coil group is arranged along the beam radial axis. A superimposed magnetic field is generated on the incident axis of the charged particle beam to control the orbit of the charged particle beam. COPYRIGHT: (C)2009,JPO&INPIT
申请公布号 JP2009054581(A) 申请公布日期 2009.03.12
申请号 JP20080195608 申请日期 2008.07.30
申请人 HITACHI HIGH-TECHNOLOGIES CORP 发明人 ITO HIROYUKI;SASAKI HIROKO;HIGUCHI YOSHIYA;KAWASAKI TAKESHI
分类号 H01J37/153 主分类号 H01J37/153
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