发明名称 Method and apparatus for measuring medium layers and interfaces between them using a multi-sensor probe
摘要 <p>A method for measuring different medium layers (4,...,4 k ) using a multi-sensor probe (6) longitudinally segmented into a plurality of segments, each segment comprising a sensor (10,...,10 n ) for measuring a predetermined physical parameter (h 1 ,...h k ) of the surrounding medium, said method comprising the steps of: - defining a measurement model, said model modelling signals of the sensors as a function of positions of a number (k) of interfaces (3,...,3 k ) between the medium layers and the physical parameters of the medium layers, - defining prior distributions of the number of the interfaces, their positions and the physical parameters, - based on the measurement model and the prior distributions determining a joint posterior distribution of the number of the interfaces and their positions, and - evaluating the joint posterior distribution of the number of the interfaces and their positions based on Markov Chain Monte Carlo (MCMC) methods.</p>
申请公布号 EP2034282(A1) 申请公布日期 2009.03.11
申请号 EP20070014224 申请日期 2007.07.19
申请人 SIEMENS MILLTRONICS PROCESS INSTRUMENTS INC. 发明人 LAROCQUE, DR. JEAN-RENE
分类号 G01F23/26 主分类号 G01F23/26
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