发明名称 Semiconductor device and method of manufacturing thereof
摘要 The manufacturing method of a semiconductor device according to the present invention comprises steps of forming a metal film, an insulating film, and an amorphous semiconductor film in sequence over a first substrate; crystallizing the metal film and the amorphous semiconductor film; forming a first semiconductor element by using the crystallized semiconductor film as an active region; attaching a support to the first semiconductor element by using an adhesive; causing separation between the metal film and the insulating film; attaching a second substrate to the separated insulating film; separating the support by removing the adhesive; forming an amorphous semiconductor film over the first semiconductor element; and forming a second semiconductor element using the amorphous semiconductor film as an active region.
申请公布号 US7501306(B2) 申请公布日期 2009.03.10
申请号 US20060523642 申请日期 2006.09.20
申请人 SEMICONDUCTOR ENERGY LABORATORY CO., LTD. 发明人 NISHI KAZUO;TAKAYAMA TORU;GOTO YUUGO
分类号 H01L21/00;H01L21/336;H01L21/77;H01L21/84;H01L27/12;H01L27/144;H01L29/786 主分类号 H01L21/00
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