发明名称 |
SEMICONDUCTOR DEVICE AND METHOD FOR FABRICATING METAL GATE OF THE SEMICONDUCTOR DEVICE |
摘要 |
<p>A semiconductor device is provided to easily control the work function of the metal gate of the semiconductor device. A semiconductor device comprises gate insulating layers (19,21) and metal gates(20,22) formed on the gate insulating layer. The metal gate includes the mixture of the metal carbide and the metal-nitride. The work function of the metal gate is determined by the rate of the metal-nitride within the metal gate and the metal carbide. The metal-nitride is TiN. The metal carbide is TiC.</p> |
申请公布号 |
KR20090024961(A) |
申请公布日期 |
2009.03.10 |
申请号 |
KR20070089958 |
申请日期 |
2007.09.05 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
PARK, SUNG HO;NOH, JIN SEO;JEON JOONG S. |
分类号 |
H01L29/78 |
主分类号 |
H01L29/78 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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