发明名称 SEMICONDUCTOR DEVICE AND METHOD FOR FABRICATING METAL GATE OF THE SEMICONDUCTOR DEVICE
摘要 <p>A semiconductor device is provided to easily control the work function of the metal gate of the semiconductor device. A semiconductor device comprises gate insulating layers (19,21) and metal gates(20,22) formed on the gate insulating layer. The metal gate includes the mixture of the metal carbide and the metal-nitride. The work function of the metal gate is determined by the rate of the metal-nitride within the metal gate and the metal carbide. The metal-nitride is TiN. The metal carbide is TiC.</p>
申请公布号 KR20090024961(A) 申请公布日期 2009.03.10
申请号 KR20070089958 申请日期 2007.09.05
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 PARK, SUNG HO;NOH, JIN SEO;JEON JOONG S.
分类号 H01L29/78 主分类号 H01L29/78
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