发明名称 Work function adjustment on fully silicided (FUSI) gate
摘要 A fully silicided gate with a selectable work function includes; a gate dielectric over the substrate; and a first metal silicide layer over the gate dielectric, and a second metal silicide layer wherein the first metal silicide has a different phase then the second metal silicide layer. The metal silicide layers comprises at least one alloy element. The concentration of the alloy element on the interface between the gate dielectric and the metal silicide layers influence the work function of the gate.
申请公布号 US7501333(B2) 申请公布日期 2009.03.10
申请号 US20060458503 申请日期 2006.07.19
申请人 TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD. 发明人 LIN WEI-JUNG;LIN CHENG-TUNG;CHANG CHIH-WEI;SHUE SHAU-LIN
分类号 H01L21/44 主分类号 H01L21/44
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