SEMICONDUCTOR INTEGRATED CIRCUIT AND MULTI TEST METHOD THEREOF

摘要

A semiconductor integrated circuit and a multi test method thereof are provided to prevent collision of data while activating a plurality of mats at the same time. A multi mode control signal generating part(100) enables one signal among up-down mat input/output switch control signals for controlling input/output switches inside up-down mats according to an up-down information address in a read operation mode. The multi mode control signal generating part activates a multi mat selection signal corresponding to one mat among down mats and one mat among up mats according to a row address in an active operation mode. A mat controller(300) receives the up-down mat input/output switch control signal and the multi mat selection signal, and enables a corresponding word line and an input/output switch.