| 摘要 |
A machine vision inspection system and method for generating a workpiece image acquisition/inspection program, which can be shared by different machine vision systems having different hardware capabilities. Each system includes a movable stage for scanning and measuring selected workpiece features, and preferably includes strobe lighting to control the effective exposure time of the workpiece image. The program provides for the determination of various image acquisition parameters, such as the stage velocity, strobe light power, strobe exposure time, etc., based on a functional limit related to image smear. Thus, the program automatically adapts to any specific system, by allowing determination of optimal image acquisition parameters for that system based on the functional limit. Accordingly, the same program is usable on different systems to consistently provide a desired level of accuracy as well as optimum or near-optimum throughput, regardless of which vision system is used.
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