发明名称 Conduction-cooled accelerated test fixture
摘要 According to one embodiment of the invention, a testing apparatus for executing highly accelerated life testing on at least one test subject includes at least one structure operable to thermally stress the test subject via conduction and at least one pneumatic hammer operable to input imparting vibrations to the test subject. According to another embodiment of the invention, a method for executing highly accelerated life testing of at least one test subject includes applying a thermal stress to the test subject via conduction at a rate of change of at least 8 ° C. per minute and imparting vibrations to the test subject at a rate of at least 3Gs rms.
申请公布号 US7498831(B2) 申请公布日期 2009.03.03
申请号 US20060278765 申请日期 2006.04.05
申请人 RAYTHEON COMPANY 发明人 KOONS MICAH S.;TOLBERT DONALD R.;TAYLOR MARK A.;MARTIN SCOTT J.
分类号 G01R31/02;G01R31/26 主分类号 G01R31/02
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