发明名称 Method for manufacturing semiconductor device
摘要 A burn-in input signal input to a burn-in circuit is delivered to an internal circuit through a selector. In response to a control signal from the burn-in circuit, the selector selects either the burn-in input signal or an input signal for operating the internal circuit. In the burn-in test process, a portion of an output signal is monitored to determine the degree of degradation of the internal circuit.
申请公布号 US7498180(B2) 申请公布日期 2009.03.03
申请号 US20060362881 申请日期 2006.02.28
申请人 RENESAS TECHNOLOGY CORP. 发明人 YAMASHITA EISAKU;TAKADA SHIGERU
分类号 H01L21/00 主分类号 H01L21/00
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