发明名称 Temperature sensor instruction signal generator and semiconductor memory device having the same
摘要 A temperature sensor instruction signal generator, which may drive a temperature sensor, and a semiconductor memory device including the same. The temperature sensor instruction signal generator may generate an instruction signal that instruct the operation of the temperature sensor using at least one of a master clock (CLK) signal, a clock enable (CKE) signal, a row address selection (RAS) signal, a column address selection (CAS) signal, a write enable (WE) signal, and a chip selection (CS) signal, wherein the instruction signal may be enabled corresponding to at least one of a self refresh mode, an auto refresh mode, and a long tRAS mode. The semiconductor memory device may include a temperature sensor and the temperature sensor instruction signal generator.
申请公布号 US7499359(B2) 申请公布日期 2009.03.03
申请号 US20060354125 申请日期 2006.02.15
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 CHOI JONG-HYUN;SEO DONG-IL;KANG YONG-GU;CHOI JUNG-YONG;SEO YOUNG-HUN
分类号 G11C7/00 主分类号 G11C7/00
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