发明名称 Etching method
摘要 In this etching method, since an etching gas is introduced before introduction of free radicals into a processing chamber, the etching gas has been adsorbed on the surface of substrates when the free radicals are introduced. Accordingly, the free radicals react with the etching gas adsorbed on the surface of the substrates, and the reaction proceeds uniformly on the surface of the substrate. As a result, nonuniform etching does not occur on the surface of the substrate. Moreover, since the reaction between the etching gas and the free radicals occurs on the surface of the substrate, an intermediate product produced according to the reaction between the etching gas and the free radicals reacts with an etching object promptly. Therefore, the intermediate product is not exhausted from the processing chamber 12 excessively, and hence the etching efficiency is high. As a result, according to this etching method, not only the in-plane distribution of the etching amount becomes more uniform, but also the etching rate is increased more than in the conventional etching method.
申请公布号 US7497963(B2) 申请公布日期 2009.03.03
申请号 US20050032393 申请日期 2005.01.10
申请人 SAMSUNG ELECTRONICS CO., LTD.;ULVAC, INC. 发明人 LEE KWANG-MYUNG;YUN KI-YOUNG;CHAE SEUNG-KI;HUH NO-HYUN;HWANG WAN-GOO;HWANG JUNG-HYUN;YANAGISAWA SHINJI;TSUTSUMI KENGO;TAKAHASHI SEIICHI
分类号 B44C1/22;H01L21/3065;H01L21/00;H01L21/302;H01L21/311;H01L21/461;H01L21/768;H01L23/522 主分类号 B44C1/22
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