发明名称 HIGH-FREQUENCY LEVEL MEASURING INSTRUMENT
摘要 FIELD: physics, measurements. ^ SUBSTANCE: invention relates to contactless measurements of level of various physical media and can be used in automated control systems of technological processes. The high-frequency level measuring instrument contains the self-oscillator of harmonic oscillations incorporating a parallel inductance-capacitance oscillatory circuit with its sensitive element representing a transmitting aerial, a phase indicator measuring shift of phases between current and voltage at the device input, an amplifier acting as a buffer in the circuit "self-oscillator - sensitive element" and preventing frequency shift and failure of self-oscillations, and a resistance indicator located and connected in parallel with the said phase indicator. Note also that the proposed level measuring instrument comprises a computer to define a computing impedance of the aerial with due allowance for data signals from the phase indicator of a phase and the resistance indicator. The resulted readings of the latter allow a contactless continuous current level measurement. ^ EFFECT: contactless continuous measurement of current level. ^ 1 dwg
申请公布号 RU2348016(C1) 申请公布日期 2009.02.27
申请号 RU20070121631 申请日期 2007.06.08
申请人 GOSUDARSTVENNOE OBRAZOVATEL'NOE UCHREZHDENIE VYSSHEGO PROFESSIONAL'NOGO OBRAZOVANIJA VORONEZHSKIJ GOSUDARSTVENNYJ ARKHITEKTURNO-STROITEL'NYJ UNIVERSITET - GOU VPO VGASU 发明人 USTINOV JURIJ FEDOROVICH;AVDEEV JURIJ VALENTINOVICH;KONONOV ALEKSANDR DAVIDOVICH;KONONOV ANDREJ ALEKSANDROVICH;IVANOV SERGEJ ALEKSANDROVICH
分类号 G01F23/28 主分类号 G01F23/28
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