发明名称 CIRCUIT OF FUSE AND FLASH MEMORY DEVICE HAVING THE SAME
摘要 A fuse circuit and a flash memory device including the same are provided to reduce an occupied area thereof by using a cell fuse having an area smaller than an area of a fuse. A plurality of memory cells are turned on or off by a first voltage according to a programming state. A switching element switches a verification signal for verifying a program of a memory cell according to a control signal(CT) and inputs the switched verification signal into the memory cell. A cell control unit(293) outputs the verification signal for controlling the program, verification, and erasure of the memory cell and the control signal of the switching element.
申请公布号 KR20090020110(A) 申请公布日期 2009.02.26
申请号 KR20070084570 申请日期 2007.08.22
申请人 HYNIX SEMICONDUCTOR INC. 发明人 JANG, CHAE KYU
分类号 G11C29/04;G11C16/34 主分类号 G11C29/04
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