| 摘要 |
<P>PROBLEM TO BE SOLVED: To provide a scan path circuit and a semiconductor integrated circuit which enable shortening of the time required for a shifting operation. <P>SOLUTION: The scan path circuit has: a first scan FF group 7 which has three serially connected scan FFs 21 and is connected to a test input terminal 3; a second scan FF group 8 which has three scan FFs 21 to which output signals of the first scan FF 21 group are given; a third scan FF group 9 which has three serially connected scan FFs 21 and is connected to a test output terminal 6; and a skip circuit 22 which inputs the output signals of the first scan FF 21 group to the second scan FF group 8 and also to the third scan FF group 9. <P>COPYRIGHT: (C)2009,JPO&INPIT |
