发明名称 FUSE CIRCUIT AND FLASH MEMORY DEVICE HAVING THE SAME
摘要 A fuse circuit in a flash memory device is disclosed. The fuse circuit includes a plurality of memory cells turned on/off by a first voltage in accordance with program state, a switching circuit configured to switch in response to a control signal, thereby transmitting a verifying signal for verifying program of the memory cell to the memory cell, and a cell controller configured to output the verifying signal for controlling program, verification and erase of the memory cells and the control signal.
申请公布号 US2009052247(A1) 申请公布日期 2009.02.26
申请号 US20080016782 申请日期 2008.01.18
申请人 HYNIX SEMICONDUCTOR INC. 发明人 JANG CHAE KYU
分类号 G11C29/00;G11C17/18 主分类号 G11C29/00
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