发明名称 METHOD AND DEVICE FOR MEASURING CELLAR PHYSICAL PROPERTY VALUES
摘要 PROBLEM TO BE SOLVED: To provide a method for measuring cellar physical properties capable of measuring cellar physical properties indicating the electrical characteristics, even with respect to an anisotropic shape of cell, and to provide a device thereof. SOLUTION: At first a cell of an object to be measured is modeled, and the complex dielectric constant when an AC electric field is applied to the cell is determined by using numerical analysis (Step S1). From the result determined, dielectric spectrum is numerically calculated to determine, while the values of film capacitance C<SB>m</SB>and cytoplasm conductivityκ<SB>i</SB>(Step S2) are varied. RiseΔεin specific inductive capacity and a relaxing timeτare determined by regressing the dielectric spectrum calculated to the dielectric relaxation expression (Step S3). The dependence on (Δε,τ) to (C<SB>m</SB>,κ<SB>i</SB>) is determined, and a regression expression corresponding to the cellar shape of an object to be measured is made (Step S4). The cellar dielectric spectrum is actually measured and the value measured is compared with that of the regression expression; and thereby cellar film capacitance C<SB>m</SB>,<SB>exp</SB>and cytoplasmκ<SB>i</SB>,<SB>exp</SB>are determined (Step S5). COPYRIGHT: (C)2009,JPO&INPIT
申请公布号 JP2009042141(A) 申请公布日期 2009.02.26
申请号 JP20070209108 申请日期 2007.08.10
申请人 SONY CORP 发明人 KATSUMOTO YOICHI;HAYASHI YOSHITO
分类号 G01N22/00;G01N27/22;G01N33/48 主分类号 G01N22/00
代理机构 代理人
主权项
地址