发明名称 Temperature testing apparatus and temperature testing method
摘要 A temperature testing apparatus includes a housing, a first fan, a second fan, a heat source device, a module, and a test unit. The housing has an inlet and an outlet. The first fan is placed near the inlet and sucks air into the housing through the inlet. The second fan is placed near the outlet and exhausting the air out of the housing through the outlet. The heat source device provides hot air to the first fan. The module is installed into the housing and the module is placed at a position near the first fan. The module is placed on hot air path formed between the inlet and the outlet. And the test unit performs an evaluation test on the module.
申请公布号 US2009052496(A1) 申请公布日期 2009.02.26
申请号 US20080153438 申请日期 2008.05.19
申请人 FUJITSU LIMITED 发明人 SONE SHUNSUKE;YAMANISHI HIROKAZU
分类号 G01K13/00 主分类号 G01K13/00
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