发明名称 SEMICONDUCTOR DEVICE, METHOD OF MANUFACTURING THE SAME AND RESISTOR
摘要 Formed on an insulator are an N- type semiconductor layer having a partial isolator formed on its surface and a P- type semiconductor layer having a partial isolator formed on its surface. Source/drain being P+ type semiconductor layers are provided on the semiconductor layer to form a PMOS transistor. Source/drain being N+ type semiconductor layers are provided on the semiconductor layer to form an NMOS transistor. A pn junction formed by the semiconductor layers is provided in a CMOS transistor made up of the transistors. The pn junction is positioned separately from the partial isolators where the crystal defect is thus very small. Therefore, the leakage current is very low at the pn junction.
申请公布号 US2009051009(A1) 申请公布日期 2009.02.26
申请号 US20080254026 申请日期 2008.10.20
申请人 发明人 IPPOSHI TAKASHI;IWAMATSU TOSHIAKI
分类号 H01L21/76;H01L29/8605;H01L21/761;H01L21/762;H01L21/822;H01L21/84;H01L27/04;H01L27/08;H01L27/12;H01L29/786;H01L29/861 主分类号 H01L21/76
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