SEMICONDUCTOR MEMORY, AND METHOD AND SYSTEM FOR TESTING SEMICONDUCTOR MEMORY

摘要

PROBLEM TO BE SOLVED: To prevent an increase of a chip size, and detect and relieve a defect of memory block. SOLUTION: Each program circuit outputs performance specification signals for showing first or second performance specifications depending on the program states. Each specification modification circuit set by a corresponding block selecting signal outputs the performance specification signal for showing the second performance specification signal. Each timing control circuit changes the output timing of a precharge control signal for a bit line corresponding to the performance specification signal. The performance specification signal from the specification modification circuit can detect defects of each memory block before programming of the program circuit, and then can relieve the defect by the program circuit. The output timing of the precharge control signal can be set for each memory block by the block selecting signal without wiring a signal line dedicated for setting each specification modification circuit, so that the increase of the chip size can be minimized. COPYRIGHT: (C)2009,JPO&INPIT