发明名称 |
PHOTOMASK AND MANUFACTURING METHOD THEREOF |
摘要 |
<p>A manufacturing method of photomask and a photomask are provided to adjust the thickness of resist layer by using the gray tone mask. The resist layer which performs the exposure under the predetermined exposure condition by using photomask is formed on the work piece layer in which the etching processing is made. A light-shielding layer(6) and a half transparent layer are formed on a transparent substrate(1). The light-shielding layer, the half transparent layer and the transparent substrate are formed by patterning the light-shielding layer and the half transparent layer. The half transparent layer has different membrane permeability of the exposure light according to the location.</p> |
申请公布号 |
KR20090020507(A) |
申请公布日期 |
2009.02.26 |
申请号 |
KR20080082039 |
申请日期 |
2008.08.21 |
申请人 |
HOYA CORPORATION |
发明人 |
YOSHIDA KOICHIRO;IMURA KAZUHISA |
分类号 |
H01L21/027;G03F1/00;G03F1/68;G03F7/20 |
主分类号 |
H01L21/027 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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