发明名称 IRRADIATION SYSTEM AND METHOD FOR CHARGED PARTICLE BEAM
摘要 PROBLEM TO BE SOLVED: To provide an irradiation system and a method for charged particle beam which reduces precision of an irradiation position of beams while ensuring safety to reduce the adjustment time for an accelerator and a beam transporting system. SOLUTION: In the system equipped with a charged particle beam generating device 3 and an irradiating device 5 having scanning electromagnets 21A, 21B which deflect charged particle beams emitted from the device 3 for scanning on a scanning surface, the charged particle beam irradiation system is equipped with a second dose monitor 27 for detecting an irradiance level in each of a plurality of partitioned regions which are partitioned to have the scanning surface smaller than a cross-section area of the beams and an irradiation control device 6 which computes an integrated irradiance level in each of the partitioned regions when the beams of the same range are emitted by moving the positions on the scanning surface and halts the emission of the beams from the device 3 to the irradiating device 5 when the computed, integrated irradiance level is determined to exceed an acceptable value which is set and stored in advance. COPYRIGHT: (C)2009,JPO&INPIT
申请公布号 JP2009039219(A) 申请公布日期 2009.02.26
申请号 JP20070205779 申请日期 2007.08.07
申请人 HITACHI LTD 发明人 FUJIMOTO RINTARO;OKAZAKI TAKASHI;FUJIMAKI HISATAKA;FUJITAKA SHINICHIRO;HIRAMOTO KAZUO;FUJII YUSUKE
分类号 A61N5/10;G21K5/00;G21K5/04 主分类号 A61N5/10
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