发明名称 Fresnel zone plate and x-ray microscope using the fresnel zone plate
摘要 [Object] To provide a Fresnel zone plate having a complex irradiation function capable of improving resolution even when the outermost opaque band width cannot be reduced and an X-ray microscope using the Fresnel zone plate. [Solution] A Fresnel zone plate 1 having a complex irradiation function according to the present invention has opaque bands 3 and transparent bands 4 arranged alternately in the radial direction from the center on a flat transparent substrate 2, and a transmission window 7 formed such that a portion of a plane wave vertically applied onto the upper surface vertically enters directly a sample 6 disposed below the Fresnel zone plate 1.
申请公布号 US2009052619(A1) 申请公布日期 2009.02.26
申请号 US20060912013 申请日期 2006.04.18
申请人 ENDOH HISAMITSU 发明人 ENDOH HISAMITSU
分类号 G21K7/00;G02B5/18 主分类号 G21K7/00
代理机构 代理人
主权项
地址