| 摘要 |
Embodiments of the present invention set the resistance value and resistance change of a magnetoresistive element as the comparison criteria of a tester without use of an actual magnetic head slider in an inspection process during fabrication of magnetic head sliders. According to one embodiment, at the time of default setting of a tester, an emulator is connected to a preamplifier of a magnetic characteristic measurement device. Signals which are obtained by emulating the resistance value and resistance change of the magnetoresistive element are inputted to the preamplifier from the emulator. The resistance value and resistance change serve as references. The output of the preamplifier is A/D converted to be inputted to the MPU. In the MPU, the A/D converted output is converted into a resistance value to be stored in the ROM. The tester uses the resistance value stored in the ROM as a reference to compare the measured resistance value of the magnetoresistive element therewith. Since the set reference value changes with time, the emulator is connected to the tester regularly for checking and adjusting the reference value.
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