A device for, an arrangement for and a method of analysing a sample

摘要

A device (100) for analysing a sample, the device (100) comprising a beam sensitive structure (101) adapted such that an electric property of a portion of the beam sensitive structure (101) is locally modified by a beam (102) impinging on the portion of the beam sensitive structure (101), and a sample accommodating unit (103) adapted for accommodating the sample, wherein the beam sensitive structure (101) and the sample accommodating unit (103) are arranged such that the local modification of the electric property of the portion of the beam sensitive structure (101) locally modifies the analysis of the sample in a corresponding portion of the sample accommodating unit (103), wherein the beam sensitive structure (101) comprises an organic photoconductor.