发明名称 BULK METALLIC GLASS SOLDERS, FOAMED BULK METALLIC GLASS SOLDERS, FOAMED-SOLDER BOND PADS IN CHIP PACKAGES, METHODS OF ASSEMBLING SAME AND SYSTEMS CONTAINING SAME
摘要 A foamed bulk metallic glass electrical connection is formed on a substrate of an integrated circuit package. The foamed bulk metallic glass electrical connection exhibits a low modulus that resists cracking during shock and dynamic loading. The foamed bulk metallic glass electrical connection is used as a solder bump for communication between an integrated circuit device and external structures. A process of forming the foamed bulk metallic glass electrical connection includes mixing bulk metallic glass with a blowing agent.
申请公布号 KR20090019852(A) 申请公布日期 2009.02.25
申请号 KR20087031046 申请日期 2007.06.12
申请人 INTEL CORP. 发明人 MIN YONGKI;SUH, DAE WOONG
分类号 H01L21/60 主分类号 H01L21/60
代理机构 代理人
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