| 摘要 |
A semiconductor device is provided to perform a driving operation by controlling driving force of a reference voltage in a test mode operation and it can operate. A semiconductor device includes a reference voltage generation unit(200), a voltage driving unit(220), a pad(240), and an internal voltage generation unit. The reference voltage generation unit generates a first regular voltage(VREF1). The voltage driving unit changes driving force according to a test signal. The pad is formed to apply a second reference voltage(VREF2) to an output node. The internal voltage generation unit generates a plurality of internal voltages on the basis of the level of the voltage applied to the output node. |
