| 发明名称 |
Semiconductor yield estimation |
| 摘要 |
A method, apparatus, and computer program product that performs yield estimates using critical area analysis on integrated circuits having redundant and non-redundant elements. The non-redundant elements are ignored or removed from the critical area analysis performed for undesired opens. |
| 申请公布号 |
US7496874(B2) |
申请公布日期 |
2009.02.24 |
| 申请号 |
US20050275275 |
申请日期 |
2005.12.21 |
| 申请人 |
INETRNATIONAL BUSINESS MACHINES CORPORATION |
发明人 |
BICKFORD JEANNE PAULETTE SPENCE;HIBBELER JASON D.;KOEHL JUERGEN;LIVINGSTONE WILLIAM JOHN;MAYUARD DANIEL NELSON |
| 分类号 |
G06F17/50 |
主分类号 |
G06F17/50 |
| 代理机构 |
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代理人 |
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