发明名称 Circuit and method for controlling write recovery time in semiconductor memory device
摘要 A circuit and a method for controlling a write recovery time (tWR) in a semiconductor memory device are disclosed. The method according to one embodiment of the present invention includes receiving an automatic precharge write command, and generating a tWR control signal, which is delayed from a point in time when the automatic precharge write command is received to a point in time when a last data segment is written in the semiconductor memory device. Therefore, power consumption and clock noise may be reduced since an operation of a counter in the circuit for controlling the tWR may be minimized after a point in time when the last data is written.
申请公布号 US7495973(B2) 申请公布日期 2009.02.24
申请号 US20070625597 申请日期 2007.01.22
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 JUNG HAN-GYUN;KO SEUNG-BUM
分类号 G11C7/00 主分类号 G11C7/00
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