发明名称 Spectroscopic analysis technique for measuring the amount of surface material on wire
摘要 In accordance with the present application, a method and system is provided for measuring an amount of surface material on a wire. A section of the wire and a beam generating device configured to generate a high energy beam are placed in a positional relationship with each other. The relationship permits a high energy beam generated from the beam generating device to impinge upon a location on the section of the wire. A reflected beam from the high energy beam is reflected from the section of the wire and is detected by a detector positioned at a location to receive the reflected beam. The beam received by the detector is investigated to determine the characteristics of the surface material on the wire.
申请公布号 US7495766(B2) 申请公布日期 2009.02.24
申请号 US20060472696 申请日期 2006.06.22
申请人 LINCCLN GLOBAL, INC. 发明人 BUTLER KEVIN;SOMMER ANDRE J.
分类号 G01N21/84 主分类号 G01N21/84
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