发明名称 Lithographic Method and Method for Testing a Lithographic Apparatus.
摘要 A method for providing a pattern on a substrate is disclosed. The method includes providing a first pattern in a first layer of photoresist and a first layer of bottom anti-reflective coating material on the substrate, etching the first pattern into the substrate, providing a second layer of photoresist and a second layer of bottom anti-reflective coating material on the substrate, providing a second pattern in the second layers of photoresist and bottom anti-reflective coating material, and etching the second pattern into the substrate, the first and second patterns on the substrate together defining the pattern.
申请公布号 NL1035771(A1) 申请公布日期 2009.02.23
申请号 NL20081035771 申请日期 2008.07.30
申请人 ASML NETHERLANDS B.V. 发明人 EDDY CORNELIS ANTONIUS VAN DER HEIJDEN;JOHANNES ANNA QUAEDACKERS;DOROTHEA MARIA CHRISTINA OORSCHOT;HIERONYMUS JOHANNUS CHRISTIAAN MEESSEN;YIN FONG CHOI
分类号 G03F7/20;H01L21/027 主分类号 G03F7/20
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